Scanning Electron Microscopy: Difference between revisions
Jump to navigation
Jump to search
No edit summary |
No edit summary |
||
| Line 5: | Line 5: | ||
|- | |- | ||
|'''Magnification Range''': 360x to 190,000x | |'''Magnification Range''': 360x to 190,000x | ||
| | | | ||
|'''Feature Resolution''': <500 nm | |'''Feature Resolution''': <500 nm | ||
|- | |- | ||
Revision as of 11:18, 28 May 2021
| PhenomXL G2 SEM | ||
|---|---|---|
 | ||
| Magnification Range: 360x to 190,000x | Feature Resolution: <500 nm | |
| Detectors: Secondary (SED) & Backscatter (BSD) | ||
| Capabilities: EDS, automated image mapping | ||
| Sample Dimensions: <3cm tall, no magnetic samples |
| Phenom ProX SEM |
|---|
 |
| Magnification Range: 40,000x to 100,000x |
| Feature Resolution: <500 nm |
| Detectors: Backscatter only |
| Capabilities: EDS |
| Sample Dimensions: <2.5cm in diameter, <3cm tall, no magnetic samples |
A scanning electron microscope (SEM) uses an electron beam than scans across a sample, allowing for much higher magnifications compared to optical microscopy. The electrons are reflected off the sample (either elestically or ineleastically) and collected by a detector, yielding an image. The MILL currently owns two benchtop SEM systems: an older Phenom ProX and a new PhenomXL G2 (acquired May 2021). Both SEMs have backscattered electron detectors (BSD) for imaging and energy-dispersive X-ray spectroscopy (EDS) systems for elemental identification. The new PhenomXL contains an additional secondary electron detector (SED), which gives the images it captures better depth of field.