X-ray Fluorescence: Difference between revisions
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m Rzhou95 moved page X-ray fluorescence spectrometer (XRF) to X-ray Fluorescence Spectrometer (XRF) |
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== Overview == | |||
X-ray fluorescence spectroscopy allows for rapid detection of the of elemental composition of samples with parts per million accuracy. Elements with atomic numbers greater than or equal to magnesium (12) can be detected. If the composition of the layers in a sample is known, the thickness of those layers can be determined. | X-ray fluorescence spectroscopy allows for rapid detection of the of elemental composition of samples with parts per million accuracy. Elements with atomic numbers greater than or equal to magnesium (12) can be detected. If the composition of the layers in a sample is known, the thickness of those layers can be determined. | ||
== Operation == | |||
Anyone who wishes to use or be trained on the XRD must undergo the general lab safety training '''AND''' the Georgia Tech Office of Radiological Safety (ORS) X-Ray Safety Training before reporting to the XRD Technical Officer. | |||
== Theory == | |||
[[Category:Equipment|char]] | [[Category:Equipment|char]] | ||
Revision as of 09:02, 9 July 2021
| Niton XRF |
|---|
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| Elemental Range: Mg and up (Z 12) |
| Sample Type: Bulk, powders, & solutions |
Overview
X-ray fluorescence spectroscopy allows for rapid detection of the of elemental composition of samples with parts per million accuracy. Elements with atomic numbers greater than or equal to magnesium (12) can be detected. If the composition of the layers in a sample is known, the thickness of those layers can be determined.
Operation
Anyone who wishes to use or be trained on the XRD must undergo the general lab safety training AND the Georgia Tech Office of Radiological Safety (ORS) X-Ray Safety Training before reporting to the XRD Technical Officer.