Scanning Electron Microscopy: Difference between revisions
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The Phenom ProX Scanning Electron Microscope can take detailed images of samples. The maximum magnification is 40,000X to 100,000X and the device is capable of resolving features to <500 nm. Samples must be less than 2.5 cm in diameter and less than 3 cm tall. Additionally, energy-dispersive x-ray spectroscopy (EDX) can be performed on samples for elemental detection through point, line, and area scans. | **here is a general description of the pages topic** The Phenom ProX Scanning Electron Microscope can take detailed images of samples. The maximum magnification is 40,000X to 100,000X and the device is capable of resolving features to <500 nm. Samples must be less than 2.5 cm in diameter and less than 3 cm tall. Additionally, energy-dispersive x-ray spectroscopy (EDX) can be performed on samples for elemental detection through point, line, and area scans. | ||
[[File:testSEM.png|frame|center|Phenom ProX Scanning Electron Microscope]] | [[File:testSEM.png|frame|center|Phenom ProX Scanning Electron Microscope]] | ||
==Theory== | |||
**Here is a brief description of the theory behind scanning electron microscopy | |||
Revision as of 16:26, 15 July 2020
- here is a general description of the pages topic** The Phenom ProX Scanning Electron Microscope can take detailed images of samples. The maximum magnification is 40,000X to 100,000X and the device is capable of resolving features to <500 nm. Samples must be less than 2.5 cm in diameter and less than 3 cm tall. Additionally, energy-dispersive x-ray spectroscopy (EDX) can be performed on samples for elemental detection through point, line, and area scans.
Theory
- Here is a brief description of the theory behind scanning electron microscopy