X-ray Diffraction
Overview
An X-ray diffractometer (XRD) detects crystalline phases in a sample by measuring the diffraction pattern of X-rays at varying angles. X-rays are used because the interplanar spacing for the vast majority of crystalline materials falls in the range of X-ray wavelengths (0.01-10 nm). The MILL’s XRD is set up for powder X-ray diffraction: for the best results, samples should be ground into a fine powder so that the collective group of crystals has a random orientation.
Operation
This tool is not available for direct usage by users. Anyone who wishes to use or be trained on the XRD must undergo the general lab safety training AND the Georgia Tech Office of Radiological Safety (ORS) X-Ray Safety Training before reporting to the XRD Technical Officer.
Otherwise, please visit Love 176 to fill out an XRD request slip and leave your sample in the XRD sample exchange box by the door. In order for your request to be processed, please email the technical officer listed on the XRD request slip to notify them.