Scanning Electron Microscopy

The Phenom ProX Scanning Electron Microscope can take detailed images of samples. The maximum magnification is 40,000X to 100,000X and the device is capable of resolving features to <500 nm. Samples must be less than 2.5 cm in diameter and less than 3 cm tall.  Additionally, energy-dispersive x-ray spectroscopy (EDX) can be performed on samples for elemental detection through point, line, and area scans.