Scanning Electron Microscopy: Difference between revisions
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m Rzhou95 moved page Scanning electron microscope (SEM) to Scanning Electron Microscope (SEM) |
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Revision as of 21:42, 5 June 2021
| PhenomXL G2 SEM |
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| Magnification Range: 360x to 190,000x |
| Feature Resolution: <500 nm |
| Detectors: Secondary (SED) & Backscatter (BSD) |
| Capabilities: EDS, automated image mapping |
| Sample Dimensions: <3cm tall, no magnetic samples |
| Phenom ProX SEM |
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| Magnification Range: 40,000x to 100,000x |
| Feature Resolution: <500 nm |
| Detectors: Backscatter only |
| Capabilities: EDS |
| Sample Dimensions: <2.5cm in diameter, <3cm tall, no magnetic samples |
A scanning electron microscope (SEM) uses an electron beam than scans across a sample, allowing for much higher magnifications compared to optical microscopy. The electrons are reflected off the sample (either elestically or ineleastically) and collected by a detector, yielding an image. The MILL currently owns two benchtop SEM systems: an older Phenom ProX and a new PhenomXL G2 (acquired May 2021). Both SEMs have backscattered electron detectors (BSD) for imaging and energy-dispersive X-ray spectroscopy (EDS) systems for elemental identification. The new PhenomXL contains an additional secondary electron detector (SED), which gives the images it captures better depth of field.