Scanning Electron Microscopy: Difference between revisions
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m Rzhou95 moved page Scanning electron microscope (SEM) to Scanning Electron Microscope (SEM) |
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{|class="infobox" | {| class="infobox" | ||
!style="font-size:135%;text-align:center;" | PhenomXL G2 SEM | !| | ||
! style="font-size:135%;text-align:center;" |PhenomXL G2 SEM | |||
! style="font-size:135%;text-align:center;" |Phenom ProX SEM | |||
|- | |- | ||
|[[File:PhenomXL.png|center|300px]] | | ||[[File:PhenomXL.png|center|300px]]||[[File:PhenomProX.png|center|300px]] | ||
|- | |- | ||
|'''Magnification Range''': 360x to 190,000x | |'''Magnification Range''':||360x to 190,000x||40,000x to 100,000x | ||
|- | |- | ||
|'''Feature Resolution''': < | |'''Feature Resolution''':|| < 500nm || < 500nm | ||
|- | |- | ||
|'''Detectors''': Secondary (SED) & Backscatter (BSD) | |'''Detectors''':||Secondary (SED) & Backscatter (BSD)||Backscatter only | ||
|- | |- | ||
|'''Capabilities''': EDS, | |'''Capabilities''':|| EDS, AIM, 3DRR || EDS | ||
|- | |- | ||
|'''Sample Dimensions''': <3cm tall, no magnetic samples | |'''Sample Dimensions''':|| <3cm tall, no magnetic samples || <2.5cm in diameter, <3cm tall, no magnetic samples | ||
|} | |} | ||
{|class="infobox" | {| class="infobox" | ||
|- | |- | ||
|[[File:PhenomProX.png|center|300px]] | |[[File:PhenomProX.png|center|300px]] | ||
|- | |- | ||
|'''Magnification Range''': 40,000x to 100,000x | |'''Magnification Range''': 40,000x to 100,000x | ||
|- | |- | ||
|'''Feature Resolution''': <500 nm | |'''Feature Resolution''': <500 nm | ||
|- | |- | ||
|'''Detectors''': Backscatter only | |'''Detectors''': Backscatter only | ||
|- | |- | ||
|'''Capabilities''': EDS | |'''Capabilities''': EDS | ||
|- | |- | ||
|'''Sample Dimensions''': <2.5cm in diameter, <3cm tall, no magnetic samples | |'''Sample Dimensions''': <2.5cm in diameter, <3cm tall, no magnetic samples | ||
|} | |} | ||
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==Theory== | ==Theory== | ||
===Electron Imaging=== | ===Electron Imaging=== | ||
===Detectors=== | === Detectors=== | ||
===EDS=== | ===EDS=== | ||
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For a video playlist with additional explanation of SEM operating procedures click [https://www.youtube.com/watch?v=F9jh7PNGqrw&list=PLuUTDbf8_YeL-z748VN6SejPdOToEacvE&index=2&t=0s here]--> | For a video playlist with additional explanation of SEM operating procedures click [https://www.youtube.com/watch?v=F9jh7PNGqrw&list=PLuUTDbf8_YeL-z748VN6SejPdOToEacvE&index=2&t=0s here]--> | ||
[[Category:Equipment|char]] | [[index.php?title=Category:Equipment|char]] | ||
Revision as of 10:52, 9 June 2021
| PhenomXL G2 SEM | Phenom ProX SEM | |
|---|---|---|
 |
 | |
| Magnification Range: | 360x to 190,000x | 40,000x to 100,000x |
| Feature Resolution: | < 500nm | < 500nm |
| Detectors: | Secondary (SED) & Backscatter (BSD) | Backscatter only |
| Capabilities: | EDS, AIM, 3DRR | EDS |
| Sample Dimensions: | <3cm tall, no magnetic samples | <2.5cm in diameter, <3cm tall, no magnetic samples |
|
| Magnification Range: 40,000x to 100,000x |
| Feature Resolution: <500 nm |
| Detectors: Backscatter only |
| Capabilities: EDS |
| Sample Dimensions: <2.5cm in diameter, <3cm tall, no magnetic samples |
A scanning electron microscope (SEM) uses an electron beam than scans across a sample, allowing for much higher magnifications compared to optical microscopy. The electrons are reflected off the sample (either elestically or ineleastically) and collected by a detector, yielding an image. The MILL currently owns two benchtop SEM systems: an older Phenom ProX and a new PhenomXL G2 (acquired May 2021). Both SEMs have backscattered electron detectors (BSD) for imaging and energy-dispersive X-ray spectroscopy (EDS) systems for elemental identification. The new PhenomXL contains an additional secondary electron detector (SED), which gives the images it captures better depth of field.