Transmission Electron Microscopy (TEM): Difference between revisions
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Transmission electron microscopy (TEM) is a type of electron microscopy with a resolving power an order of magnitude greater than [[Scanning electron microscopy (SEM)]] by milling the sample down to a foil < 100 nm thick, then detecting electrons which pass through the now electron-transparent sample. This drastically reduces the electron interaction volume and dispersions, improving spatial resolution. Samples < 50 nm thick may even be able to get atomic-level resolution. Maximum resolution lies in the 0.2 nm range, with a maximum magnification of 1,000,000x. | Transmission electron microscopy (TEM) is a type of electron microscopy with a resolving power an order of magnitude greater than [[Scanning Electron Microscope (SEM) | Scanning electron microscopy (SEM)]] by milling the sample down to a foil < 100 nm thick, then detecting electrons which pass through the now electron-transparent sample. This drastically reduces the electron interaction volume and dispersions, improving spatial resolution. Samples < 50 nm thick may even be able to get atomic-level resolution. Maximum resolution lies in the 0.2 nm range, with a maximum magnification of 1,000,000x. | ||
Latest revision as of 14:51, 12 July 2021
Transmission electron microscopy (TEM) is a type of electron microscopy with a resolving power an order of magnitude greater than Scanning electron microscopy (SEM) by milling the sample down to a foil < 100 nm thick, then detecting electrons which pass through the now electron-transparent sample. This drastically reduces the electron interaction volume and dispersions, improving spatial resolution. Samples < 50 nm thick may even be able to get atomic-level resolution. Maximum resolution lies in the 0.2 nm range, with a maximum magnification of 1,000,000x.